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Proceedings Paper

Unbiased estimation of linewidth roughness
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Paper Abstract

Linewidth roughness (LWR) is usually estimated simply as three standard deviations of the linewidth. The effect of image noise upon this metric includes a positive nonrandom component. The metric is therefore subject to a bias or "systematic error" that we have estimated can be comparable in size to the roughness itself for samples as smooth as required by the industry roadmap. We illustrate the problem using scanning electron microscope images of rough lines. We propose simple changes to the measurement algorithm that, if adopted by metrology instrument suppliers, would permit estimation of LWR without bias caused by image noise.

Paper Details

Date Published: 10 May 2005
PDF: 9 pages
Proc. SPIE 5752, Metrology, Inspection, and Process Control for Microlithography XIX, (10 May 2005); doi: 10.1117/12.599981
Show Author Affiliations
J. S. Villarrubia, National Institute of Standards and Technology (United States)
B. D. Bunday, International SEMATECH Manufacturing Initiative (United States)


Published in SPIE Proceedings Vol. 5752:
Metrology, Inspection, and Process Control for Microlithography XIX
Richard M. Silver, Editor(s)

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