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Proceedings Paper

Mechanisms and applications of femtosecond laser induced nanostructures
Author(s): Jianrong Qiu; Yasuhiko Shimotsuma; K. Miura; Peter Kazansky; Kazuyuki Hirao
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Paper Abstract

Femtosecond laser has been widely used in microscopic modifications to materials due to its ultra-short laser pulse and ultrahigh light intensity. When a transparent material e.g. glass is irradiated by a tightly focused femtosecond laser, the photo-induced reaction is expected to occur only near the focused part of the laser beam inside the glass due to the multiphoton processes. We observed various induced localized microstructures e.g. color center defects, refractive index change, micro-void and micro-crack, in glasses after the femtosecond laser irradiation, and discussed the possible applications of the microstructures in the fabrication of various micro-optical components, e.g. optical waveguide, micro-grating, micro-lens, fiber attenuator, 3-dimensional optical memory. In this paper, we review our recent investigations on single femtosecond laser-beam induced nanostructures. We introduce the space-selective nanoscale valence state manipulation of active ions, precipitation and control of metal nanoparticles and observation of polarization-dependent permanent nanostructures, and discuss the mechanisms and possible applications of the observed phenomena.

Paper Details

Date Published: 12 April 2005
PDF: 11 pages
Proc. SPIE 5713, Photon Processing in Microelectronics and Photonics IV, (12 April 2005); doi: 10.1117/12.598090
Show Author Affiliations
Jianrong Qiu, Shanghai Insitute of Optics and Fine Mechanics, CAS (China)
Japan Science and Technology Agency (Japan)
Yasuhiko Shimotsuma, Kyoto Univ. (Japan)
K. Miura, Kyoto Univ. (Japan)
Peter Kazansky, Univ. of Southampton (United Kingdom)
Kazuyuki Hirao, Kyoto Univ. (Japan)


Published in SPIE Proceedings Vol. 5713:
Photon Processing in Microelectronics and Photonics IV
Jim Fieret; David B. Geohegan; Friedrich G. Bachmann; Willem Hoving; Frank Träger; Peter R. Herman; Jan J. Dubowski; Tatsuo Okada; Kunihiko Washio; Yongfeng Lu; Craig B. Arnold, Editor(s)

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