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Proceedings Paper

Design and fabrication of a novel settled and laminated testing instrument for magnetorheological fluid
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Paper Abstract

As having ability of changing its apparent viscosity in presence of magnetic field in millisecond, magnetorheological fluids (MRF) exhibit widely potential application in devices or systems for controlling vibration and noise. In addition to shear stress strength, another import performance index of MRF is its stability under long time static state. For most applied conditions, without hard agglomeration is more important than higher shear stress strength. However, up to now, only a few reports pay attention to evaluate method of MRF's settling. This make it is difficult to optimize manufacturing technique of MRF and study its principle. A novel testing instrument, which made based on theory of that varying magnetic particle's volume content of MRF would induce its correspondingly changing of magnetic conductivity, designed and fabricated. And settling state of several MRF were tested by that instrument, factors which influence accuracy of that instrument is also discussed. Research shows that, the novel settled and laminated testing instrument (NSLTI) is potential to be used to evaluate settling stator and monitor settling process of magnetic particles. Moreover, study also shows that strength of magnetic field, position of magnetic field sensor, sensitivity of Tesla meter, type of MRF and testing time may influence accuracy of NSLTI.

Paper Details

Date Published: 5 May 2005
PDF: 8 pages
Proc. SPIE 5762, Smart Structures and Materials 2005: Industrial and Commercial Applications of Smart Structures Technologies, (5 May 2005); doi: 10.1117/12.597708
Show Author Affiliations
Xinchun Guan, Harbin Institute of Technology (China)
Jinhai Li, Harbin Institute of Technology (China)
Jinping Ou, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 5762:
Smart Structures and Materials 2005: Industrial and Commercial Applications of Smart Structures Technologies
Edward V. White, Editor(s)

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