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Proceedings Paper

Image registration in high-dimensional feature space
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Paper Abstract

We will present a new approach for pattern matching which is applicable to very high dimensional features. This approach is based on maximizing a novel non-linear measure of "mutual information" which is constructed from the k nearest neighbor graph through the feature vector set.

Paper Details

Date Published: 11 March 2005
PDF: 15 pages
Proc. SPIE 5674, Computational Imaging III, (11 March 2005); doi: 10.1117/12.597635
Show Author Affiliations
Huzefa F. Neemuchwala, Univ. of Michigan (United States)
Alfred O. Hero, Univ. of Michigan (United States)

Published in SPIE Proceedings Vol. 5674:
Computational Imaging III
Charles A. Bouman; Eric L. Miller, Editor(s)

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