Share Email Print
cover

Proceedings Paper

Array scanner as microdensitometer surrogate: a deal with the devil or… a great deal?
Author(s): Donald R. Williams
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Inexpensive and easy-to-use linear and area-array scanners have frequently substituted as densitometers for low-frequency (i.e., large-area) hard copy image metrology. Increasingly, they are also being tasked for high spatial frequency, image microstructure metrology, which is reserved for high-performance microdensitometers that use microscope optics, photomultiplier tubes (PMT), and log amps. It is hard to resist their adoption for such use though, given the convenience level. Their high speed, large scan areas, auto-focus, discomfiting low cost, and low operator skill requirements makes one question if their use for such purpose is somehow too good to be true. To confidently judge their limitations requires a comprehensive signal and noise spatial frequency performance evaluation with respect to available driver options. This paper will outline and demonstrate evaluation techniques that use existing ISO metrology standards for modulation transfer function (MTF), noise, and dynamic range with a comparison to a Photometric Data Systems (PDS) microdensitometer

Paper Details

Date Published: 17 January 2005
PDF: 6 pages
Proc. SPIE 5668, Image Quality and System Performance II, (17 January 2005); doi: 10.1117/12.597085
Show Author Affiliations
Donald R. Williams, Eastman Kodak Co. (United States)


Published in SPIE Proceedings Vol. 5668:
Image Quality and System Performance II
Rene Rasmussen; Yoichi Miyake, Editor(s)

© SPIE. Terms of Use
Back to Top