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Proceedings Paper

3D-Pathology: a real-time system for quantitative diagnostic pathology and visualisation in 3D
Author(s): Christian Gottrup; Mark George Beckett; Henrik Hager; Peter Locht
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Paper Abstract

The 3D-Pathology project has created a novel microscope system that realises, for the pathologist at their work bench, real-time analysis of three-dimensional, digital images from transmitted light microscopy (TLM). The system incorporates: 1. A software application that facilitates the role of the pathologist to: a.survey a microscopic specimen, at low resolution; b.identify and digitally capture one or more regions of interest (ROI) within the specimen, at high resolution; c.perform an image reconstruction on the ROI to enhance the contrast and detail; · analyse and manipulate the reconstructed ROI, for diagnostic purposes; · all from the comfort of their desktop personal computer. 2. A hardware prototype that includes: a.a stage platform, to position the specimen; b.a microscope and digital camera assembly, to acquire image data; c.a custom-built interface, to allow the hardware to be controlled from a personal computer. Key to the success of the system is the availability of an appropriate model of the image distortion that occurs within the optical system. Such a model has been devised, based on the assumption that distortion can be described as the convolution of the ideal image and a point spread function which expresses the effects of absorption within the specimen. Current computational techniques for deconvolution are applied to recover a high quality digital representation of the original specimen.

Paper Details

Date Published: 25 February 2005
PDF: 9 pages
Proc. SPIE 5671, Real-Time Imaging IX, (25 February 2005); doi: 10.1117/12.596891
Show Author Affiliations
Christian Gottrup, Dimac A/S (Denmark)
Mark George Beckett, Univ. of Edinburgh (United Kingdom)
Henrik Hager, Aarhus Univ. Hospital (Denmark)
Peter Locht, Dimac A/S (Denmark)


Published in SPIE Proceedings Vol. 5671:
Real-Time Imaging IX
Nasser Kehtarnavaz; Phillip A. Laplante, Editor(s)

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