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Proceedings Paper

A CMOS image sensor with high-speed readout of multiple regions-of-interest for an opto-navigation system
Author(s): Koji Yamamoto; Yuki Maeda; Yasuo Masaki; Keiichiro Kagawa; Masahiro Nunoshita; Jun Ohta
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Paper Abstract

We propose a CMOS image sensor which can capture both whole images at 60 fps and several region-of-interests (ROIs) images at a high-speed frame rate of 2.1 kfps. We have designed a sensor prototype for our newly developed man-machine interface system called “Opto-Navigation”. In the system, LEDs as optical beacons are equipped with portable devices such as mobile phones and digital cameras, and provide a useful guide for visually aided data communication with them. The optical beacons inform their positions at slow frequency around 10 Hz, which define ROIs, and send their ID data with bit rate of 1kbps to the sensor. The sensor can recognize the position of IDs with frame differences of 60-fps images and then obtain the ID data by reading only ROIs at high frame rate. Thus by using the image sensor a user can know what devices can be communicated with and select one of them to send/receive information data. A QVGA image sensor dedicated for the “Opto-Navi” system has been fabricated in a 0.35-μm 2-poly 3-metal standard CMOS technology. The pixel has 7.5 × 7.5 μm2 area with a fill factor of 24.9%.

Paper Details

Date Published: 7 March 2005
PDF: 8 pages
Proc. SPIE 5677, Sensors and Camera Systems for Scientific and Industrial Applications VI, (7 March 2005); doi: 10.1117/12.596755
Show Author Affiliations
Koji Yamamoto, Nara Institute of Science and Technology (Japan)
Yuki Maeda, Japan Science and Technology Agency (Japan)
Yasuo Masaki, Funai Electric Co., Ltd. (Japan)
Keiichiro Kagawa, Nara Institute of Science and Technology (Japan)
Masahiro Nunoshita, Nara Institute of Science and Technology (Japan)
Jun Ohta, Nara Institute of Science and Technology (Japan)


Published in SPIE Proceedings Vol. 5677:
Sensors and Camera Systems for Scientific and Industrial Applications VI
Morley M. Blouke, Editor(s)

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