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Proceedings Paper

Fs-laser fabrication of photonic structures in glass: the role of glass composition
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Paper Abstract

The use of fs lasers to directly write phonic structures inside a glass has great potential as a fabrication method for three-dimensional all-optical integrated components. The ability to use this technique with different glass compositions --specifically tailored for a specific photonics application -- is critical to its successful exploitation. Consequently, it is important to understand how glass composition effects waveguide fabrication with fs laser pulses and how different glasses are structurally modified after exposure to fs laser pulses. We have used confocal laser spectroscopy to monitor the changes in glass structure that are associated with waveguide fabrication. Using a low power continuous wave (cw) Ar laser as excitation source we have measured both Raman and fluorescence spectra of the modified regions. Raman spectroscopy provides us with information on the network structure, whereas fluorescence measurements reveal the presence of optically active point defects in the glass. In this paper we review our work on fs-laser fabrication and characterization of photonic structures in glass and discuss the effect of glass composition on processing parameters and structural modification.

Paper Details

Date Published: 8 October 2004
PDF: 10 pages
Proc. SPIE 5662, Fifth International Symposium on Laser Precision Microfabrication, (8 October 2004); doi: 10.1117/12.595762
Show Author Affiliations
Denise M. Krol, Univ. of California/Davis (United States)
Lawrence Livermore National Lab. (United States)
James W. Chan, Lawrence Livermore National Lab. (United States)
Thomas R. Huser, Lawrence Livermore National Lab. (United States)
Subhash H. Risbud, Univ. of California/Davis (United States)
Joseph S. Hayden, Schott Glass Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 5662:
Fifth International Symposium on Laser Precision Microfabrication
Isamu Miyamoto; Henry Helvajian; Kazuyoshi Itoh; Kojiro F. Kobayashi; Andreas Ostendorf; Koji Sugioka, Editor(s)

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