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Proceedings Paper

Performance tests on a-Si TFT arrays for flat panel digital x-ray detectors
Author(s): A. Couture; D. Albagli; G. Possin; H. Hudspeth; P. Janiszewski; M. Zoeller; P. Granfors
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Paper Abstract

We report on a set of tests that measure the performance of a-Si flat panel TFT arrays used in digital x-ray detectors. During production of high performance TFT panels for applications such as mammography it is important to verify the integrity and quality of the TFT array at progressive stages of production. Early identification of failing TFT arrays as well as continuous monitoring of the production process can result in early termination of poor quality panels, quick identification of the root cause of failures, and correction of process drift to prevent failures from occurring. We present results of a system designed to test the performance of a-Si TFT arrays during the production process. Metrics which are important to x-ray image quality were tested, including FET performance, pixel capacitance, storage capacitor lag and diode leakage. Functional tests were performed entirely on pixels in the imaging array using timing and biasing conditions that mimic x-ray illumination.

Paper Details

Date Published: 20 April 2005
PDF: 8 pages
Proc. SPIE 5745, Medical Imaging 2005: Physics of Medical Imaging, (20 April 2005); doi: 10.1117/12.595559
Show Author Affiliations
A. Couture, GE Global Research Ctr. (United States)
D. Albagli, GE Global Research Ctr. (United States)
G. Possin, GE Global Research Ctr. (United States)
H. Hudspeth, GE Global Research Ctr. (United States)
P. Janiszewski, GE Global Research Ctr. (United States)
M. Zoeller, GE Global Research Ctr. (United States)
P. Granfors, GE Healthcare c/o PerkinElmer (United States)


Published in SPIE Proceedings Vol. 5745:
Medical Imaging 2005: Physics of Medical Imaging
Michael J. Flynn, Editor(s)

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