Share Email Print
cover

Proceedings Paper

VCSEL reliability: a user's perspective
Author(s): David K. McElfresh; Leoncio D. Lopez; Robert Melanson; Dan Vacar
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

VCSEL arrays are being considered for use in interconnect applications that require high speed, high bandwidth, high density, and high reliability. In order to better understand the reliability of VCSEL arrays, we initiated an internal project at SUN Microsystems, Inc. In this paper, we present preliminary results of an ongoing accelerated temperature-humidity-bias stress test on VCSEL arrays from several manufacturers. This test revealed no significant differences between the reliability of AlGaAs, oxide confined VCSEL arrays constructed with a trench oxide and mesa for isolation. This test did find that the reliability of arrays needs to be measured on arrays and not be estimated with the data from singulated VCSELs as is a common practice.

Paper Details

Date Published: 14 March 2005
PDF: 8 pages
Proc. SPIE 5737, Vertical-Cavity Surface-Emitting Lasers IX, (14 March 2005); doi: 10.1117/12.594362
Show Author Affiliations
David K. McElfresh, Sun Microsystems, Inc. (United States)
Leoncio D. Lopez, Sun Microsystems, Inc. (United States)
Robert Melanson, Sun Microsystems, Inc. (United States)
Dan Vacar, Sun Microsystems, Inc. (United States)


Published in SPIE Proceedings Vol. 5737:
Vertical-Cavity Surface-Emitting Lasers IX
Chun Lei; Kent D. Choquette, Editor(s)

© SPIE. Terms of Use
Back to Top