Share Email Print
cover

Proceedings Paper

Spectral analysis of surfaces at subwavelength resolution
Author(s): Raoul Kopelman; Steven Smith; Weihong Tan; Renato Zenobi; Klony S. Lieberman; Aaron Lewis
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published: 1 May 1992
PDF: 8 pages
Proc. SPIE 1637, Environmental and Process Monitoring Technologies, (1 May 1992); doi: 10.1117/12.59322
Show Author Affiliations
Raoul Kopelman, Univ. of Michigan (United States)
Steven Smith, Univ. of Michigan (United States)
Weihong Tan, Univ. of Michigan (United States)
Renato Zenobi, Univ. of Michigan (United States)
Klony S. Lieberman, Hebrew Univ. of Jerusalem (Israel)
Aaron Lewis, Hebrew Univ. of Jerusalem (Israel)


Published in SPIE Proceedings Vol. 1637:
Environmental and Process Monitoring Technologies
Tuan Vo-Dinh, Editor(s)

© SPIE. Terms of Use
Back to Top