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Proceedings Paper

Nonlinear behavior of laser-induced damage in KDP and DKDP under multiwavelength irradiation
Author(s): Paul DeMange; Raluca A. Negres; Harry B. Radousky; Stavros G. Demos
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Paper Abstract

The damage performance of potassium dihydrogen phosphate (KDP, and its deuterated analog DKDP) crystals under multi-wavelength, simultaneous exposure to the harmonics of a nanosecond Nd:YAG laser system is of particular interest because it approximates the conditions taking place during frequency conversion. In this work, damage initiation under simultaneous exposure to two pulses at different wavelengths is investigated as a function of fluence in both KDP and DKDP. We have developed a novel damage testing instrumentation which allows us to measure the damage pinpoint density as a function of laser parameters, including wavelength, fluence, and pulse-length. This new method enables us to carefully quantify the damage effects of both, single-wavelength and dual-wavelength pulsed irradiation. In the latter case, we measure the laser-induced damage behavior when the fluence at one wavelength is varied while the fluence of the second wavelength is kept constant. Our results suggest that the behavior of laser-induced damage initiation under simultaneous multi-wavelength irradiation is complex and crystal dependent.

Paper Details

Date Published: 23 March 2005
PDF: 6 pages
Proc. SPIE 5710, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications IV, (23 March 2005); doi: 10.1117/12.592066
Show Author Affiliations
Paul DeMange, Lawrence Livermore National Lab. (United States)
Univ. of California/Davis (United States)
Raluca A. Negres, Lawrence Livermore National Lab. (United States)
Harry B. Radousky, Lawrence Livermore National Lab. (United States)
Univ. of California/Davis (United States)
Stavros G. Demos, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 5710:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications IV
Peter E. Powers, Editor(s)

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