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Proceedings Paper

Damage threshold of microstructured optical fibres
Author(s): Laurent F. Michaille; Terence John Shepherd; David Maurice Taylor; Keith L. Lewis
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Paper Abstract

Laser damage thresholds of 10 and 20 micron-core diameter solid-core photonic crystal fibres (PCF) and hollow-core photonic band gap (PBG) fibres have been measured. The studies were carried out using a Nd:Yag laser (30nsec pulses at 10Hz), which is optimally coupled into the fibres by careful mode matching, providing a coupling efficiency greater than 90%. It has been shown that the damage threshold of the 10-micron PBG fibre occurs for pulse energies close to 1 mJ, equivalent to a fluence well in excess of 1kJ/cm2 propagating down the fibre. This is a factor of 4 larger than the damage threshold of the 10-micron diameter solid-core PCF. However, the damage threshold of the large-core PBG is smaller than that of the PCF. Theoretical modelling based only on the optical modal properties of the single-mode PBG fibre shows that an enhancement by a factor 25 should be obtainable. Thus there are different mechanisms potentially responsible for the fragility of larger core PBG fibres. In an experimental study of bend losses it ahs been found that it is possible to bend the 10-micron PBG fibre up to the breaking point bend radius (less than 1mm). The critical bend radius for the 20-micron PCF. A summary will be presented of the results of the experimental and theoretical studies, highlighting possible reasons for the observed trends for the two different forms of fibre.

Paper Details

Date Published: 21 February 2005
PDF: 2 pages
Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); doi: 10.1117/12.592014
Show Author Affiliations
Laurent F. Michaille, QinetiQ (United Kingdom)
Terence John Shepherd, QinetiQ (United Kingdom)
David Maurice Taylor, QinetiQ (United Kingdom)
Keith L. Lewis, QinetiQ (United Kingdom)

Published in SPIE Proceedings Vol. 5647:
Laser-Induced Damage in Optical Materials: 2004
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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