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Proceedings Paper

Characterization of a reflective spatial light modulator by determination of its Jones matrix
Author(s): J. Andilla; Estela Martin-Badosa; Santiago Vallmitjana
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Paper Abstract

We propose a novel spatial light modulator (SLM) characterization method based on ellipsometric techniques, in which the Jones matrix describing the SLM polarization capabilities can be obtained and then used for any arbitrary configuration of the device. We have used it to characterize a reflecting SLM (analogue ferroelectric liquid crystal from Boulder Nonlinear Systems).

Paper Details

Date Published: 21 October 2004
PDF: 7 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591964
Show Author Affiliations
J. Andilla, Univ. de Barcelona (Spain)
Estela Martin-Badosa, Univ. de Barcelona (Spain)
Santiago Vallmitjana, Univ. de Barcelona (Spain)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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