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Proceedings Paper

Analysis of variations of the thickness-phase objects by lateral shearing interferometry and white light scanning interferometry
Author(s): Hernando R. Altamar; Arturo Plata
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Paper Abstract

The interferometric techniques of lateral shearing and white light scanning interferometry are combined to determine the variations of thickness of phase objects and the thickness of such objects is approximated through B-splines functions.

Paper Details

Date Published: 21 October 2004
PDF: 6 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591957
Show Author Affiliations
Hernando R. Altamar, Univ. Industrial de Santander (Colombia)
Arturo Plata, Univ. Industrial de Santander (Colombia)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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