Share Email Print
cover

Proceedings Paper

Ultra low noise photodetectors with internal discrete amplification
Author(s): Krishna Rao Linga; Edward E. Godik; Wayne A. Seemungal; D. Shushakov; Vitaly E. Shubin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have designed and developed a new family of photodetectors with Internal Discrete Amplification (IDA) mechanism. These photodetectors can operate in linear (analog) detection mode with gain-bandwidth product up to 5.1014 and few-photon sensitivity as well as in the photon counting mode with count rates up to 108 cps. Some of their key performance characteristics exceed those of photomultiplier tube (PMT) and avalanche photodiode (APD) devices. The measured parameters of the detectors are gain > 105, excess noise factor as low as 1.02, maximum count rate > 108 counts/s, and rise/fall time < 300 ps.

Paper Details

Date Published: 7 April 2005
PDF: 9 pages
Proc. SPIE 5726, Semiconductor Photodetectors II, (7 April 2005); doi: 10.1117/12.591746
Show Author Affiliations
Krishna Rao Linga, Amplification Technologies, Inc. (United States)
Edward E. Godik, Amplification Technologies, Inc. (United States)
Wayne A. Seemungal, Amplification Technologies, Inc. (United States)
D. Shushakov, Amplification Technologies, Inc. (United States)
Vitaly E. Shubin, Amplification Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 5726:
Semiconductor Photodetectors II
Marshall J. Cohen; Eustace L. Dereniak, Editor(s)

© SPIE. Terms of Use
Back to Top