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Proceedings Paper

High-power, high-reliability laser diodes
Author(s): Donald R. Scifres; David F. Welch; Richard R. Craig; Erik P. Zucker; Jo S. Major; Gary L. Harnagel; Masamichi Sakamoto; James M. Haden; John G. Endriz; Hsing H. Kung
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Paper Abstract

Results are presented on catastrophic damage limits and life-test measurements for four types of high-power laser diodes operating at wavelengths between 980 nm and 690 nm. The laser diodes under consideration are CW multimode lasers, CW laser bars, quasi-CW bars/2D stacked arrays, and single transverse mode lasers.

Paper Details

Date Published: 26 June 1992
PDF: 6 pages
Proc. SPIE 1634, Laser Diode Technology and Applications IV, (26 June 1992); doi: 10.1117/12.59136
Show Author Affiliations
Donald R. Scifres, Spectra Diode Labs., Inc. (United States)
David F. Welch, Spectra Diode Labs., Inc. (United States)
Richard R. Craig, Spectra Diode Labs., Inc. (United States)
Erik P. Zucker, Spectra Diode Labs., Inc. (United States)
Jo S. Major, Spectra Diode Labs., Inc. (United States)
Gary L. Harnagel, Spectra Diode Labs., Inc. (United States)
Masamichi Sakamoto, Spectra Diode Labs., Inc. (United States)
James M. Haden, Spectra Diode Labs., Inc. (United States)
John G. Endriz, Spectra Diode Labs., Inc. (United States)
Hsing H. Kung, Spectra Diode Labs., Inc. (United States)


Published in SPIE Proceedings Vol. 1634:
Laser Diode Technology and Applications IV
Daniel S. Renner, Editor(s)

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