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Proceedings Paper

Laser shock processing system by underwater irradiation (532 nm) in metal surface
Author(s): G. Gomez-Rosas; Jose Luis Ocana; Carlos Rubio; Carlos Molpeceres; W. Chi-Moreno; Miguel Morales; Z. Castellanos; Juan Antonio Porro; G. Rodriguez-Vilomara
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Paper Abstract

Laser shock processing (LSP) has been proposed as a competitive alternative technology to classical treatments for improving fatigue and wear resistance of metals. We present a configuration and results in the LSP concept for metal surfaces treatments in underwater laser irradiation at 535 nm. A convergent lens is used to deliver 0.9 J/cm2 in an 8 ns laser FWHM pulse produced by 10 Hz Q-switched Nd:YAG Laser with spots of a 1.5 mm in diameter moving forward along the workpiece. A LSP configuration with experimental results using a pulse density of 2 500 pulses/cm2 and 5 000 pulses/cm2 in 6061-T6 aluminum samples are presented by 532 nm. High level of compressive residual stresses are produced (600 MPa-750 MPa) with a depth of 1.2 mm. It has been shown that surface residual stress level is comparable to that achieved by conventional shot peening, but with greater depths. This method can be applied to surface treatment of final metal products.

Paper Details

Date Published: 21 October 2004
PDF: 5 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591136
Show Author Affiliations
G. Gomez-Rosas, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Jose Luis Ocana, Univ. Politecnica de Madrid (Spain)
Carlos Rubio, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Carlos Molpeceres, Univ. Politecnica de Madrid (Spain)
W. Chi-Moreno, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Miguel Morales, Univ. Politecnica de Madrid (Spain)
Z. Castellanos, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Juan Antonio Porro, Univ. Politecnica de Madrid (Spain)
G. Rodriguez-Vilomara, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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