Share Email Print
cover

Proceedings Paper

Measurement of Stark parameters of HeII P-Alpha, P-Beta and P-Gamma spectral lines
Author(s): Santiago Mar; F. Rodriguez; R. J. Pelaez; J. A. Aparicio; V. R. Gonzalez; Juan Antonio del Val
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical diagnostics is a known and powerful tool to obtain information concerning the processes involved inside and around plasma. In the case of helium plasmas, they are present in industrial applications, like welding or cutting processes and in scientific research, like the inertial confinement plasmas or astrophysical analysis. This work reports information on the pressure broadened profiles of the HEII Paschen-alpha (Pα), Paschen-beta (Pβ) and Paschen-gamma (Pγ) spectral lines measured in a pulsed discharge lamp. Information relative to the line shapes, full width at 1/2, 1/4 and 1/8 of the maximum intensity and the dip of the HEII 320.3 nm is provided. The electron density has been determined by two-wavelength interferometry and from the Stark width of the HEI 501.6 nm and ranges during the HeII emission from 0.54 to 0.64 1023 m-3 in the plasma. Temperature (1.7 - 2.4 eV) has been simultaneously determined from the Boltzmann-plot of HEI and from local thermodynamic equilibrium (LTE) assumptions. The final results have been compared with most of the previous existing data.

Paper Details

Date Published: 21 October 2004
PDF: 6 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.590856
Show Author Affiliations
Santiago Mar, Univ. de Valladolid (Spain)
F. Rodriguez, Univ. de Valladolid (Spain)
R. J. Pelaez, Univ. de Valladolid (Spain)
J. A. Aparicio, Univ. de Valladolid (Spain)
V. R. Gonzalez, Univ. de Valladolid (Spain)
Juan Antonio del Val, Univ. de Salamanca (Spain)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

© SPIE. Terms of Use
Back to Top