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Proceedings Paper

Reproducibility improvement in color measurements of periodic objects
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Paper Abstract

A common and known problem in textile industry is the measurement of color and of their fabrics for quality control. Commercial equipment is limited to color measurements of objects with homogeneous surfaces. In the case of samples with no-homogeneous surfaces it is recommended the use of accessories such as an integrating sphere that averages the in-homogeneities along with the averaging of several measurements taken for different orientations of the sample. However, single measurements with these devices are still not precise enough. In order to solve this problem we proposed a novel system for color measurement of periodic objects. In a first stage we have presented novel illumination geometry capable to produce an homogeneous illumination over periodic objects. The measurements were made with a two-aperture radiometer which is coupled to the illumination setup. This system was used to measure the reflectance produced by a textile sample. In this work, we present the second stage, where the system is improved in order to measure color directly from textile samples. We present the results from a comparison between our system and a commercial one.

Paper Details

Date Published: 21 October 2004
PDF: 6 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.590805
Show Author Affiliations
Jose-German R. Cortes-Reynoso, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Jose Guadalupe Suarez-Romero, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Juan Bautista Hurtado-Ramos, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)
Eduardo Tepichin Rodriguez, Instituto Nacional de Astrofisica, Optica y Electronica (Mexico)
Juan Carlos Solorio-Leyva, Ctr. de Ingenieria y Desarrollo Industrial (Mexico)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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