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Proceedings Paper

Real-time optical monitoring of the dip coating process
Author(s): Alexandre F. Michels; T. Menegotto; Hans-Peter P. Grieneisen; C. V. Santilli; S. H. Pulcinelli; Flavio Horowitz
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Paper Abstract

A significant part of film production by the coating industry is based on wet bench processes, where better understanding of their temporal dynamics could facilitate control and optimization. In this work, in situ laser interferometry is applied to study properties of flowing liquids and quantitatively monitor the dip coating batch process. Two oil standards -- Newtonian, non-volatile, with constant refractive indices and distinct flow properties -- were measured under several withdrawing speeds. The dynamics of film physical thickness then depends on time as t-1/2, and flow characterization becomes possible with high precision (linear slope uncertainty of ±0.04%). Resulting kinematic viscosities for OP60 and OP400 are 1,17 ± 0,03 St and 9,9 ± 0,2 St, respectively. These results agree with nominal values, as provided by the manufacturer. For more complex films (a mutli-component sol-gel Zirconyl Chloride aqueous solution) with a varying refractive index, through a direct polarimetric measurement, allowing also determination of the temporal evolution of physical thickness (uncertainty of ± 0,007 microns) is also determined during dip coating.

Paper Details

Date Published: 21 October 2004
PDF: 6 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.590759
Show Author Affiliations
Alexandre F. Michels, Univ. Federal do Rio Grande do Sul (Brazil)
T. Menegotto, Univ. Federal do Rio Grande do Sul (Brazil)
Hans-Peter P. Grieneisen, Univ. Federal do Rio Grande do Sul (Brazil)
C. V. Santilli, Univ. Estadual de Sao Paulo (Brazil)
S. H. Pulcinelli, Univ. Estadual de Sao Paulo (Brazil)
Flavio Horowitz, Univ. Federal do Rio Grande do Sul (Brazil)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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