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Proceedings Paper

Planar glass integrated optical structure based on prism decoupling for sensing applications
Author(s): Celia A. Sanchez-Perez; Elise Ghibaudo; Jean-Emmanuel Broquin; Augusto Garcia-Valenzuela; A. Esparza-Garcia; M. A. Camacho-Lopez
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Paper Abstract

We present the design of an innovating integrated planar structure adapted for intensity or phase measurements. It is based on the evanescent prism decoupling of the optical signal from a waveguide used as the sensing element. The device is formed by successive thin film sputtering deposition. A TiO2 crystalline layer forms the gas sensing element from which light is coupled out by a planar high refractive index prism. We experimentally validate the structure.

Paper Details

Date Published: 31 March 2005
PDF: 8 pages
Proc. SPIE 5728, Integrated Optics: Devices, Materials, and Technologies IX, (31 March 2005); doi: 10.1117/12.590590
Show Author Affiliations
Celia A. Sanchez-Perez, Univ. Nacional Autonoma de Mexico (Mexico)
Elise Ghibaudo, Univ. Nacional Autonoma de Mexico (Mexico)
Institute de Microelectronique, Electromagnetisme et Photonique, CNRS (France)
Jean-Emmanuel Broquin, Institute de Microelectronique, Electromagnetisme et Photonique, CNRS (France)
Augusto Garcia-Valenzuela, Univ. Nacional Autonoma de Mexico (Mexico)
A. Esparza-Garcia, Univ. Nacional Autonoma de Mexico (Mexico)
M. A. Camacho-Lopez, Univ. Autonoma del Estado de Mexico (Mexico)


Published in SPIE Proceedings Vol. 5728:
Integrated Optics: Devices, Materials, and Technologies IX
Yakov Sidorin; Christoph A. Waechter, Editor(s)

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