Share Email Print
cover

Proceedings Paper

Measurement of propagation characteristics of optical printed circuit board with low-coherence interferometer
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, the measurement system based on optical low-coherence interferometry was constructed to characterize propagation characteristics of Optical-Printed Circuit Board (O-PCB). With this system, the propagation loss of optical waveguides embedded in O-PCB was measured, and the back-reflection from several interfaces within O-PCB was done also. The polymer optical waveguide was prepared with UV embossing technique and its core had the width of 50um, the height of 50um, and the length of 2cm, respectively. The propagation loss of the waveguide was measured to be less than 2dB/cm and the back-reflectance at each interconnection point was about 5.83%. In the near future, the sensitivity will be improved with applying the balanced detection and signal modulation techniques in order to measure propagation characteristics of more complex O-PCB.

Paper Details

Date Published: 25 March 2005
PDF: 6 pages
Proc. SPIE 5729, Optoelectronic Integrated Circuits VII, (25 March 2005); doi: 10.1117/12.590119
Show Author Affiliations
Wonsoo Ji, Inha Univ. (South Korea)
Sungjun Jang, Inha Univ. (South Korea)
Beom-Hoan O, Inha Univ. (South Korea)
Se-Geun Park, Inha Univ. (South Korea)
El-Hang Lee, Inha Univ. (South Korea)
Seung Gol Lee, Inha Univ. (South Korea)


Published in SPIE Proceedings Vol. 5729:
Optoelectronic Integrated Circuits VII
Louay A. Eldada; El-Hang Lee, Editor(s)

© SPIE. Terms of Use
Back to Top