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Proceedings Paper

Long-wavelength VCSELs for applications in absorption spectroscopy: tuning rates and modulation performances
Author(s): Alexandre Lytkine; Wolfgang Jaeger; John Tulip
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Paper Abstract

We used direct absorption spectroscopy for characterization of long-wavelength VCSELs (VERTILAS, Germany). Gas mixture CO:CO2=1:1 (total pressure 0.1 - 0.5 bar) provided in the tuning ranges of lasers a multitude of absorption lines spaced by intervals from 1 to 60 GHz that allowed the absolute calibration of laser scans. We measured tuning rates of the VCSELs in 0-50 °C temperature interval in dependence on injection current and modulation frequency varied from 0 up to 6.5 mA and 500 kHz respectively. The continuous tuning range of the 1577.5-nm VCSEL with single-mode output of up to 1.5 mW was found to be of 9.61 nm (38.62 cm-1). The temperature tuning rates for all VCSELs under study were in the range between -0.4 and -0.5 cm-1/ °C. The current tuning rates, varied from laser to laser between -1.9 and -2.2 cm-1/mA at low injection currents and modulation frequencies, were found to be twice as big for all lasers at high injection currents and decreased by factor 2 and 5 at modulation frequencies of 300 and 500 kHz respectively. A phase shift between the amplitude and frequency modulations was measured by fine tuning VCSEL with a DC injection current to display the end of a laser scan in respect to a local maximum in laser power. The phase shift changed from 0 to -0.3 rad with modulation frequency raised from 500 Hz to 500 kHz. The results of phase shift measurements have been compared with those obtained recently for DFB lasers with different methods.

Paper Details

Date Published: 14 March 2005
PDF: 10 pages
Proc. SPIE 5737, Vertical-Cavity Surface-Emitting Lasers IX, (14 March 2005); doi: 10.1117/12.589949
Show Author Affiliations
Alexandre Lytkine, Univ. of Alberta (Canada)
Wolfgang Jaeger, Univ. of Alberta (Canada)
John Tulip, Univ. of Alberta (Canada)


Published in SPIE Proceedings Vol. 5737:
Vertical-Cavity Surface-Emitting Lasers IX
Chun Lei; Kent D. Choquette, Editor(s)

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