Share Email Print
cover

Proceedings Paper

Experimental and theoretical studies of broadband optical thermal damage to the retina
Author(s): Robert J. Thomas; Gavin D. Buffington; Michael L. Edwards; Clarence P. Cain; Kurt J. Schuster; David J. Stolarski; Benjamin A. Rockwell
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The evaluation of the safety of high-power light sources requires a broad understanding of both thermal and photochemical damage mechanisms in retinal tissue. A comprehensive model which can support complex spectral, temporal and spatial dependency of these effects is essential to evaluation of existing safe exposure limits across a broad parameter space. We present an initial implementation of a thermal damage model along with validating experiments. The model is capable of examining a wide parameter space and is highly extensible to the examination of a variety of damage mechanisms. Also presented is a recent study which examines the effects of a filtered Xenon arc lamp for an exposure duration of ten seconds. This data is examined in relation to the model and a number of historical data points. We also examine exposure limits from the American Council of Government Industrial Hygienists as they apply to these sources.

Paper Details

Date Published: 18 April 2005
PDF: 12 pages
Proc. SPIE 5688, Ophthalmic Technologies XV, (18 April 2005); doi: 10.1117/12.589936
Show Author Affiliations
Robert J. Thomas, Air Force Research Lab. (United States)
Gavin D. Buffington, Fort Hays State Univ. (United States)
Michael L. Edwards, Air Force Research Lab. (United States)
Clarence P. Cain, Northrop Grumman Corp. (United States)
Kurt J. Schuster, Northrop Grumman Corp. (United States)
David J. Stolarski, Northrop Grumman Corp. (United States)
Benjamin A. Rockwell, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 5688:
Ophthalmic Technologies XV
Fabrice Manns; Bruce E. Stuck; Michael Belkin; Per G. Söderberg; Arthur Ho, Editor(s)

© SPIE. Terms of Use
Back to Top