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Proceedings Paper

Experimental fluorescence optical tomography using adaptive finite elements and planar illumination with modulated excitation light
Author(s): Amit Joshi; Wolfgang Bangerth; Alan B. Thompson Jr.; Eva M. Sevick-Muraca
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Paper Abstract

Fluorescence enhance optical tomography is an emerging imaging tool for investigating the molecular tissue environments in vivo. Owing to the scattering nature of near infrared radiation in tissue, iterative tomography approaches must employ the coupled diffusion equations for three-dimensional recovery of fluorescent properties from tissue boundary measurements. Unfortunately, the inverse problem suffers from computational inefficiency and ill-posed ness. Furthermore, the resolution attained in fluorescence tomography is limited by a priori fixed discretization of finite element/finite difference schemes used. These difficulties can be ameliorated by employing adaptive discretization strategies. To date, the efficacy of adaptive mesh refinement techniques has yet to be demonstrated in clinically relevant medical imaging situations. In this contribution we present a novel fluorescence tomography scheme which employs dual adaptive finite element meshes for three dimensional reconstructions of fluorescent targets beneath the simulated tissue surface. Image reconstructions for 1cm3 fluorescent target placed at the depth of 1 cm from the illumination surface are presented for target to background rations (TBRs) of 1:0 and 100:1 on the basis of dye concentration.

Paper Details

Date Published: 28 April 2005
PDF: 8 pages
Proc. SPIE 5693, Optical Tomography and Spectroscopy of Tissue VI, (28 April 2005); doi: 10.1117/12.589800
Show Author Affiliations
Amit Joshi, Texas A&M Univ. (United States)
Wolfgang Bangerth, Univ. of Texas at Austin (United States)
Alan B. Thompson Jr., Texas A&M Univ. (United States)
Eva M. Sevick-Muraca, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 5693:
Optical Tomography and Spectroscopy of Tissue VI
Britton Chance; Robert R. Alfano; Bruce J. Tromberg; Mamoru Tamura; Eva M. Sevick-Muraca, Editor(s)

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