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Proceedings Paper

Lateral resolution enhancement in confocal self-interference microscopy
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Paper Abstract

Lateral resolution enhancement in confocal self-interference microscopy (CSIM) is evaluated. CSIM, which uses the birefringence of the calcite plate to generate self-interference pattern, sharpens the central lobe of the effective spot. Numerical simulation results of two-dimensional imaging performances are presented. Two-point resolution of 149nm is achieved, which is enhanced by nearly 100% compared to that of confocal microscopy.

Paper Details

Date Published: 24 March 2005
PDF: 12 pages
Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, (24 March 2005); doi: 10.1117/12.589526
Show Author Affiliations
DongKyun Kang, Korea Advanced Institute of Science and Technology (South Korea)
DaeGab Gweon, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 5701:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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