Share Email Print
cover

Proceedings Paper

Angular selectivity behavior of a grating imaging in thick photorefractive media
Author(s): Myrian C. Tebaldi; K. Contreras; Nestor A. Bolognini
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

It is well known that a thin phase grating holographically produced exhibits Raman-Nath behavior and a thick phase grating shows Bragg behavior in the diffraction process. In the Raman-Nath regime several diffracted waves are produced. Usually, in a photorefractive material such as a sillenite BSO crystal, volume phase holograms are stored by means of the interference of two coherent beams intersecting inside the crystal. In our work, we analyze the diffraction properties of gratings incoherently stored in a photorefractive medium. To this purpose, an input Ronchi grating is incoherently imaged in a thick BSO crystal. The grating is stored on a birefringence modulation basis. In the reconstruction step, when a collimated beam impinges perpendicularly to the crystal input face several diffracted orders appear in accordance with the Raman-Nath regime. As far as the read-out beam direction is rotated the diffraction efficiency of each order changes. The angular selectivity behavior of the grating in terms of the crystal thickness and the grating period is analyzed. The adequate selection of the write-in parameters allow to highlight a determined order and to achieve multiple storage, without cross-talk.

Paper Details

Date Published: 21 October 2004
PDF: 6 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.589356
Show Author Affiliations
Myrian C. Tebaldi, Ctr. de Investigaciones Opticas (Argentina)
Univ. Nacional de La Plata (Argentina)
K. Contreras, Pontificia Univ. Catolica del Peru (Peru)
Nestor A. Bolognini, Ctr. de Investigaciones Opticas (Argentina)
Univ. Nacional de La Plata (Argentina)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

© SPIE. Terms of Use
Back to Top