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Proceedings Paper

Measurement of the third order nonlinear coefficients of organic materials by a holographic technique in the picosecond regime
Author(s): L. Rodriguez; Christos Simos; Mamadou Sylla; Aristides Alfredo Marcano O.; Xuan Nguyen Phu
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Paper Abstract

We have developed a method which yields the real and the imaginary parts of third-order susceptibility of material media. We have applied this method to determine the nonlinear refractive index (n2) of new synthesized organic materials in the picosecond regime (30 ps pulse duration at 1064 nm wavelength). The results obtained show the efficiency of this technique for measuring low values of the nonlinear refraction coefficient n2 in diluted materials.

Paper Details

Date Published: 21 October 2004
PDF: 5 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.589229
Show Author Affiliations
L. Rodriguez, Lab. des Proprietes Optiques des Materiaux et Applications, CNRS (France)
Instituto Venezolano de Investigaciones Cientificas (Venezuela)
Christos Simos, Lab. des Proprietes Optiques des Materiaux et Applications, CNRS (France)
Mamadou Sylla, Lab. des Proprietes Optiques des Materiaux et Applications, CNRS (France)
Aristides Alfredo Marcano O., Instituto Venezolano de Investigaciones Cientificas (Venezuela)
Xuan Nguyen Phu, Lab. des Proprietes Optiques des Materiaux et Applications, CNRS (France)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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