Share Email Print

Proceedings Paper

Assessing the effectiveness of technology transfer from U.S. government R&D laboratories: impact of market orientation
Author(s): Barry Bozeman; Karen Coker
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This study, based on a national survey of U.S. government laboratories, assesses the degree of success laboratories have had in transferring technology to industry, taking into account the laboratories' differing receptivity to market influences. Three success criteria are considered here, two based on self-evaluations and a third based on the number of technology licenses issued from the laboratory. The two self-evaluations are rooted in different types of effectiveness, `getting technology out the door,' in one case, and, in the other, having a demonstrable commercial impact. A core hypothesis of the study is that the two types of effectiveness will be responsive to different factors and, in particular, the laboratories with a clearer market orientation will have a higher degree of success on the commercial impact and technology license criteria. Overall, the results seem to suggest that multifaceted, multimission laboratories are likely to enjoy the most success in technology transfer, especially if they have relatively low levels of bureaucratization and either ties to industry (particularly direct financial ties) or a commercial orientation in the selection of projects.

Paper Details

Date Published: 12 May 1992
PDF: 14 pages
Proc. SPIE 1617, International Competitiveness and Business Techniques in Advanced Optics and Imaging, (12 May 1992); doi: 10.1117/12.58921
Show Author Affiliations
Barry Bozeman, Syracuse Univ. (United States)
Karen Coker, Syracuse Univ. (United States)

Published in SPIE Proceedings Vol. 1617:
International Competitiveness and Business Techniques in Advanced Optics and Imaging
Ernest Sternberg; Allen J. Krisiloff; Roland R. Schindler, Editor(s)

© SPIE. Terms of Use
Back to Top