Share Email Print

Proceedings Paper

Pixel crosstalk and correlation with modulation transfer function of CMOS image sensor
Author(s): Magali Estribeau; Pierre Magnan
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Modulation Transfer Function is a common metric used to quantify image quality but inter-pixel crosstalk analysis is also of interest. Because of an important number of parameters influencing MTF, its analytical calculation and crosstalk predetermination are not an easy task for a CMOS image sensor, due to the use of several metal line and transistor in a close proximity of the photodetector. A dedicated test chip (using a technology optimized for imaging applications) has been developed in order to get both MTF data and influence of the various areas of the pixel to its own response and the one of its neighbors. In order to evaluate the contribution of pixel elementary patterns (particularly the in-pixel readout circuitry), several kernels of shielded pixels have been implemented with the central pixel locally unmasked. Analyze of the kernel responses provides a good insight on both Quantum Efficiency and crosstalk contributors. Additionally, the top metal layer has been used to implement metal edge pattern allowing the on-chip measurement of Edge Spread Function so the MTF. The results obtained with pixel kernels and direct MTF measurements, performed on the same chip at different wavelengths, are analyzed and compared in order to correlate them and draw conclusions that can be applied at the design level.

Paper Details

Date Published: 7 March 2005
PDF: 11 pages
Proc. SPIE 5677, Sensors and Camera Systems for Scientific and Industrial Applications VI, (7 March 2005); doi: 10.1117/12.588382
Show Author Affiliations
Magali Estribeau, SUPAERO (France)
Pierre Magnan, SUPAERO (France)

Published in SPIE Proceedings Vol. 5677:
Sensors and Camera Systems for Scientific and Industrial Applications VI
Morley M. Blouke, Editor(s)

© SPIE. Terms of Use
Back to Top