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Proceedings Paper

Automatic inspection of manufactured parts in the one-of-a-kind production
Author(s): Ulrich Berger; Willi Hornfeld
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Paper Abstract

The purpose of this paper is to describe the development, design, and application of a general purpose testing, inspection, and surveillance platform for one-of-a-kind production. Products are, for example, ships and aeroplanes, or complex systems like nuclear power plants. In these areas, the earliest possible detection of faults could reliably assure the quality of products and constructions. The inspection and surveillance platform contains a flexible industrial robot in five-axis geometry-specification combined with a multi-sensor array. The multi-sensor-systems are modular and, e.g., divided into thermographic (nonvisible) techniques, gray-scale (visible) techniques, and case specific sensor-data processing systems. To improve the capacity of nondestructive testing (NDT) and inspection procedures, the image processing interface is connected to a local area network. Thus the evaluation of test results by several human or machine-vision interpreters can be done in a very effective way. Two applications are described. The first application is described as surface inspection of composite and ceramic coated materials. Here the detection of flaws and the suppression of image structures proceeding from object irregularities will be discussed. The second one deals with the automatic detection and location of leaks vessel parts. In this field the thermographic sensor system is combined with a gray-scale detector. This method is very suitable for engines, jet propulsions, and other similar components.

Paper Details

Date Published: 1 March 1992
PDF: 12 pages
Proc. SPIE 1615, Machine Vision Architectures, Integration, and Applications, (1 March 1992); doi: 10.1117/12.58815
Show Author Affiliations
Ulrich Berger, BIBA/Univ. Bremen (Germany)
Willi Hornfeld, STN Systemtechnik Nord (Germany)

Published in SPIE Proceedings Vol. 1615:
Machine Vision Architectures, Integration, and Applications
Bruce G. Batchelor; Michael J. W. Chen; Frederick M. Waltz, Editor(s)

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