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Proceedings Paper

An extreme ultraviolet spectrometer
Author(s): Leonid V. Didkovsky; Darrell L. Judge; Andrew R. Jones
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Paper Abstract

A concept and preliminary design of an Extreme Ultraviolet (EUV) spectrometer is presented. The spectrometer is based on a gas ionization chamber and an advanced eight-electrode electron focusing system to form a narrow electron beam on a photodiode aperture. The design is modeled with the SIMulation of IONs (SIMION) tools and shows the ability to scan through the spectral range of 20.0 - 40.6 nm by changing the potential on a single control electrode between about 200 and 1100 V. The spectral resolution is about 0.25 nm in the middle of the band. The set of the focusing potentials may be changed to allow detection of solar EUV radiation in a wider spectral band, e.g. 5.0 - 50.0 nm. The potentials may be also optimized to improve the spectral resolution in a required spectral window.

Paper Details

Date Published: 7 March 2005
PDF: 12 pages
Proc. SPIE 5677, Sensors and Camera Systems for Scientific and Industrial Applications VI, (7 March 2005); doi: 10.1117/12.588001
Show Author Affiliations
Leonid V. Didkovsky, Univ. of Southern California/Los Angeles (United States)
Darrell L. Judge, Univ. of Southern California/Los Angeles (United States)
Andrew R. Jones, Univ. of Southern California/Los Angeles (United States)


Published in SPIE Proceedings Vol. 5677:
Sensors and Camera Systems for Scientific and Industrial Applications VI
Morley M. Blouke, Editor(s)

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