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Proceedings Paper

1/f noise measurement in CMOS image sensors
Author(s): Boyd Fowler; Steve Mims; Brett Frymire
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Paper Abstract

This paper describes an in-situ pixel source follower power spectral density (PSD) measurement method that does not require any specialized test equipment. This method requires a dual port CMOS image sensor with analog outputs that allow differential time series noise measurements. We describe the sensor circuits and measurement techniques used for collecting data. We derive an estimator for the PSD based on the measured data. We also present a technique for estimating the confidence interval of the PSD based on Bootstrap re-sampling. Using our estimate of the PSD, we derive estimators for the SPICE NLEV3 1/f noise model parameters AF and KF. We also determine confidence intervals for these estimators. Using this method we present the estimated source follower PSD for a CMOS image sensor fabricated in a 0.18μm CMOS process with 3.3μm X 3.3μm pixels. We also present the estimated values of AF and KF based on the estimated PSD.

Paper Details

Date Published: 23 February 2005
PDF: 9 pages
Proc. SPIE 5678, Digital Photography, (23 February 2005); doi: 10.1117/12.587952
Show Author Affiliations
Boyd Fowler, Agilent Technologies (United States)
Steve Mims, Fairchild Imaging (United States)
Brett Frymire, Agilent Technologies (United States)

Published in SPIE Proceedings Vol. 5678:
Digital Photography
Nitin Sampat; Jeffrey M. DiCarlo; Ricardo J. Motta, Editor(s)

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