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Proceedings Paper

BTDF of ZnSe and BRDF of Ge with multilayer coatings at 3.39 microns
Author(s): Michael M. Yang; Lawrence M. Scherr; Karen J. Sorensen
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Paper Abstract

BTDF at 3.39 microns was measured on ZnSe substrates and on substrates with 1/2, 2/3, and full multilayer coatings. BRDF at 3.39 microns was also measured on Ge substrates with multilayer coatings. The BTDF and BRDF range for coated samples overlaps the range for the uncoated substrates.

Paper Details

Date Published: 1 January 1992
PDF: 16 pages
Proc. SPIE 10261, Infrared Thin Films: A Critical Review, 102610C (1 January 1992); doi: 10.1117/12.58696
Show Author Affiliations
Michael M. Yang, GenCorp/Aerojet Electronic Systems (United States)
Lawrence M. Scherr, GenCorp/Aerojet Electronic Systems (United States)
Karen J. Sorensen, GenCorp/Aerojet Electronic Systems (United States)


Published in SPIE Proceedings Vol. 10261:
Infrared Thin Films: A Critical Review
Ric P. Shimshock, Editor(s)

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