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Proceedings Paper

Thin film coatings for improved IR detector performance
Author(s): J. Earl Rudisill; Hue Thi-Bach Nguyen
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Paper Abstract

Gain enhancement from IR detectors could be realized if they were antireflection (AR) coated. The feasibility of AR coating silicon surfaces over the 6 to 11 micron and 11 to 17 micron bands has been demonstrated using single and double-layer coatings. The band averaged reflectance values were reduced from about 30% to about 4% with double-layer coatings. The actual spectral reflectance curves agreed very closely to the computer-modelled performances. Temperature and material-pair parameters were established that resulted in thermally durable combinations. The coated silicon was successfully cycled between room temperature and 77 degrees Kelvin. Application of this coating to Si:As Impurity Band Conduction detectors was successfully demonstrated in the 6 to 11 micron spectral band.

Paper Details

Date Published: 1 January 1992
PDF: 15 pages
Proc. SPIE 10261, Infrared Thin Films: A Critical Review, 1026109 (1 January 1992); doi: 10.1117/12.58693
Show Author Affiliations
J. Earl Rudisill, Laser Power Optics (United States)
Hue Thi-Bach Nguyen, Laser Power Optics (United States)


Published in SPIE Proceedings Vol. 10261:
Infrared Thin Films: A Critical Review
Ric P. Shimshock, Editor(s)

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