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Proceedings Paper

Polarization imaging applied to 3D reconstruction of specular metallic surfaces
Author(s): Olivier Morel; Fabrice Meriaudeau; Christophe Stolz; Patrick Gorria
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Paper Abstract

We propose a new application of « Shape from Polarization » method to reconstruct surface shapes of specular metallic objects. Studying the polarization state of the reflected light is very useful to get information on the surface normals. After reflection, an unpolarized light wave becomes partially linearly polarized. Such a wave, can be described by its three parameters: intensity, degree of polarization, and angle of polarization. By using the refractive index of the surface, a relationship between the degree of polarization and the reflection angle can be established. Unfortunately, the relation commonly used for dielectrics, cannot be applied since the refractive index of metallic surfaces is complex. To get a similar relation, we apply a usual approximation valid in the visible region. The Fresnel reflectance model can also provide a relationship between the angle of polarization and the incidence plane orientation. Thus, the reflection angle and the incidence plane orientation give the surface normals. The shape is finally computed by integrating the normals with a relaxation algorithm. Applications on metallic objects made by stamping and polishing are also described, and show the efficiency of our system to discriminate shape defects. Future works will consist in integrating the system into an automatic process of defects detection.

Paper Details

Date Published: 24 February 2005
PDF: 9 pages
Proc. SPIE 5679, Machine Vision Applications in Industrial Inspection XIII, (24 February 2005); doi: 10.1117/12.586815
Show Author Affiliations
Olivier Morel, Le2i-CNRS, Univ. de Bourgogne (France)
Fabrice Meriaudeau, Le2i-CNRS, Univ. de Bourgogne (France)
Christophe Stolz, Le2i-CNRS, Univ. de Bourgogne (France)
Patrick Gorria, Le2i-CNRS, Univ. de Bourgogne (France)


Published in SPIE Proceedings Vol. 5679:
Machine Vision Applications in Industrial Inspection XIII
Jeffery R. Price; Fabrice Meriaudeau, Editor(s)

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