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Proceedings Paper

Diode laser spectrometer for line profile measurements
Author(s): V. G. Avetisov; Alexander I. Nadezhdinskii; Amir N. Khusnutdinov; Patimat M. Omarova; Mikhail V. Zyrianov
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Paper Abstract

A diode laser spectrometer has been used for high accuracy line profile measurements in the 1.7-2.4 micron region. Measured lineshapes have been least-squares fitted by Voigt profile with flating Gaussian component. Gaussian component pressure dependence resulting from the Dicke narrowing effect is observed. Line intensities, self-induced broadenings, and shifts of five water vapor lines near 5475/cm are also presented.

Paper Details

Date Published: 1 April 1992
PDF: 12 pages
Proc. SPIE 1724, Tunable Diode Laser Applications, (1 April 1992); doi: 10.1117/12.58672
Show Author Affiliations
V. G. Avetisov, General Physics Institute (Russia)
Alexander I. Nadezhdinskii, General Physics Institute (Russia)
Amir N. Khusnutdinov, General Physics Institute (Russia)
Patimat M. Omarova, General Physics Institute (Russia)
Mikhail V. Zyrianov, General Physics Institute (Russia)

Published in SPIE Proceedings Vol. 1724:
Tunable Diode Laser Applications
Alexander I. Nadezhdinskii; Alexander M. Prokhorov, Editor(s)

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