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Proceedings Paper

The nature of emission from optical breakdown induced by pulses of fs and ns duration
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Paper Abstract

Spectral emission from optical breakdown in the bulk of a transparent dielectric contains information about the nature of the breakdown medium. We have made time resolved measurements of the breakdown induced emission caused by nanosecond and femtosecond infrared laser pulses. We previously demonstrated that the emission due to ns pulses is blackbody in nature allowing determination of the fireball temperature and pressure during and after the damage event. The emission due to femtosecond pulse breakdown is not blackbody in nature; two different spectral distributions being noted. In one case, the peak spectral distribution occurs at the second harmonic of the incident radiation, in the other the distribution is broader and flatter and presumably due to continuum generation. The differences between ns and fs breakdown emission can be explained by the differing breakdown region geometries for the two pulse durations. The possibility to use spectral emission as a diagnostic of the emission region morphology will be discussed.

Paper Details

Date Published: 21 February 2005
PDF: 7 pages
Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); doi: 10.1117/12.585925
Show Author Affiliations
Christopher Wren Carr, Lawrence Livermore National Lab. (United States)
Michael D. Feit, Lawrence Livermore National Lab. (United States)
Alexander M. Rubenchik, Lawrence Livermore National Lab. (United States)
Paul P. DeMange, Lawrence Livermore National Lab. (United States)
Sergei O. Kucheyev, Lawrence Livermore National Lab. (United States)
Michael D. Shirk, Lawrence Livermore National Lab. (United States)
Harry B. Radousky, Lawrence Livermore National Lab. (United States)
Stavros G. Demos, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 5647:
Laser-Induced Damage in Optical Materials: 2004
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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