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Proceedings Paper

Subpicosecond Z-scan measurements of the nonlinear refractive index of dense materials
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Paper Abstract

We present the results of Z-scan studies on a new setup in the sub-picosecond regime (central wavelength 800nm) carried out on solid and liquid materials such as pure water and silica. These measurements are made possible thanks to a high sensitivity setting up of our Z-scan method and in-situ characterizations of the spatio-temporal parameters of the beam. Besides, with the use of a newly adapted numerical simulation, only calibration errors of measurement devices are significant. These measurements are then used to separate the different contributions to the nonlinear refractive index from nanosecond scale mechanisms like electrostriction and/or thermal relaxation.

Paper Details

Date Published: 21 February 2005
PDF: 8 pages
Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); doi: 10.1117/12.585435
Show Author Affiliations
Franck Billard, Institut Fresnel, CNRS (France)
Mireille Commandre, Institut Fresnel, CNRS (France)
Claude Amra, Institut Fresnel, CNRS (France)
Jean-Yves Natoli, Institut Fresnel, CNRS (France)
Hassan Akhouayri, Institut Fresnel, CNRS (France)

Published in SPIE Proceedings Vol. 5647:
Laser-Induced Damage in Optical Materials: 2004
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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