Share Email Print
cover

Proceedings Paper

Source patterning in time-resolved infrared radiometry of composite structures
Author(s): Jane W. Maclachlan Spicer; W. D. Kerns; Leonard C. Aamodt; John C. Murphy
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A quantitative thermographic NDE technique for the characterization of composite materials is under development along with supporting theoretical analysis. The TRIR technique differs from other pulsed thermography techniques in that the surface temperature of the specimen is monitored as a function of time during the application of a step heating pulse to the sample. Full-field images with temporal resolution faster than video frame rates are acquired with an infrared scanner by disabling the vertical galvanometer in the infrared camera and scanning the heating source across the sample. Alternatively, an InSb focal plane array is used to acquire the time-resolved images. The geometry of the heating source is selected to optimize the acquisition of information about the structure of composite materials. Experimental results in both simple and hybrid composite systems are discussed. The depth and lateral extent of interlaminar separation in composites subjected to impact loading are presented and the use of lateral heat flow techniques to image vertical defect structures is examined.

Paper Details

Date Published: 1 April 1992
PDF: 10 pages
Proc. SPIE 1682, Thermosense XIV: An Intl Conf on Thermal Sensing and Imaging Diagnostic Applications, (1 April 1992); doi: 10.1117/12.58542
Show Author Affiliations
Jane W. Maclachlan Spicer, Johns Hopkins Univ. (United States)
W. D. Kerns, Johns Hopkins Univ. (United States)
Leonard C. Aamodt, Johns Hopkins Univ. (United States)
John C. Murphy, Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 1682:
Thermosense XIV: An Intl Conf on Thermal Sensing and Imaging Diagnostic Applications
Jan K. Eklund, Editor(s)

© SPIE. Terms of Use
Back to Top