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Proceedings Paper

Quantization of accumulated diffused errors in error diffusion
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Paper Abstract

Quantization of the accumulated diffused error (ADE) is an effective means to reduce on-chip storage in a hardware implementation of error diffusion. A simple uniform quantizer can yield a factor of 2 savings with no apparent loss in image quality. Nonuniform quantizers with memory that depend on the quantizer index or various features13 can yield even greater savings -- up to a factor of 4, with essentially no loss in image quality. However, these quantizers depend on the trainability of the tone-dependent error diffusion (TDED) framework to achieve this level of quality. In addition, the design of the quantizers must be coupled to that of the TDED parameters in either a sequential or iterative fashion.

Paper Details

Date Published: 17 January 2005
PDF: 12 pages
Proc. SPIE 5667, Color Imaging X: Processing, Hardcopy, and Applications, (17 January 2005); doi: 10.1117/12.584688
Show Author Affiliations
Ti-chiun Chang, Siemens Corporate Research, Inc. (United States)
Jan P. Allebach, Purdue Univ. (United States)

Published in SPIE Proceedings Vol. 5667:
Color Imaging X: Processing, Hardcopy, and Applications
Reiner Eschbach; Gabriel G. Marcu, Editor(s)

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