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Proceedings Paper

Organic electro-optic materials
Author(s): Larry Raymond Dalton; Bruce H. Robinson; Alex K.-Y. Jen; Philip Ried; Bruce Eichinger; Sei-Hum Jang; Jingdong Luo; Sen Liu; Yi Liao; Kimberly A. Firestone; Nishant P. Bhatambrekar; Denise Bale; Marnie A. Haller; Sanchali Bhattacharjee; Jessica Schendel; Philip A. Sullivan; Scott Hammond; Nicholas Buker; Field Cady; Antao Chen; William H. Steier
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Paper Abstract

The potential of organic electro-optic materials for large electro-optic activity and fast response to applied electric fields (leading to 100 GHz device bandwidths) is important and increasingly well-recognized. In this communication, we demonstrate how quantum and statistical mechanical calculations can be used to guide the systematic improvement of both molecular first hyperpolarizability (β) and macroscopic electro-optic activity (r). Femtosecond time-resolved, wavelength-agile Hyper-Rayleigh Scattering (HRS) measurements have been used to measure β values relative to chloroform and to avoid confusion associated with two photon contributions. Electro-optic coefficients have been characterized by simple reflection (Teng-Man method), attenuated total reflection (ATR), and Mach Zehnder interferometry. "Constant bias" modifications of these techniques have been used to permit investigation of optimized poling conditions. Organic electro-optic materials also afford unique advantages for the fabrication of conformal and flexible devices, for the integration of disparate materials, and for exploitation of novel manufacturing technologies such as soft lithography. Both stripline and ring microresonator structures have been fabricated by soft lithography. The integration of organic electro-optic materials with silicon photonics (both split ring microresonators and photonic bandgap circuitry) has been demonstrated.

Paper Details

Date Published: 16 December 2004
PDF: 12 pages
Proc. SPIE 5621, Optical Materials in Defence Systems Technology, (16 December 2004); doi: 10.1117/12.584102
Show Author Affiliations
Larry Raymond Dalton, Univ. of Washington (United States)
Bruce H. Robinson, Univ. of Washington (United States)
Alex K.-Y. Jen, Univ. of Washington (United States)
Philip Ried, Univ. of Washington (United States)
Bruce Eichinger, Univ. of Washington (United States)
Sei-Hum Jang, Univ. of Washington (United States)
Jingdong Luo, Univ. of Washington (United States)
Sen Liu, Univ. of Washington (United States)
Yi Liao, Univ. of Washington (United States)
Kimberly A. Firestone, Univ. of Washington (United States)
Nishant P. Bhatambrekar, Univ. of Washington (United States)
Denise Bale, Univ. of Washington (United States)
Marnie A. Haller, Univ. of Washington (United States)
Sanchali Bhattacharjee, Univ. of Washington (United States)
Jessica Schendel, Univ. of Washington (United States)
Philip A. Sullivan, Univ. of Washington (United States)
Scott Hammond, Univ. of Washington (United States)
Nicholas Buker, Univ. of Washington (United States)
Field Cady, Univ. of Washington (United States)
Antao Chen, Univ. of Washington (United States)
William H. Steier, Univ. of Southern California (United States)


Published in SPIE Proceedings Vol. 5621:
Optical Materials in Defence Systems Technology
Anthony W. Vere; James G. Grote; Francois Kajzar, Editor(s)

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