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Proceedings Paper

Evaluation of a novel reflectance-based system for optical property measurement
Author(s): Divyesh Sharma; Anant Agrawal; Stephanie Matchette; T. Joshua Pfefer
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Date Published:
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Proc. SPIE NIH101, Optical Imaging Workshop, ; doi: 10.1117/12.583751
Show Author Affiliations
Divyesh Sharma, U.S. Food and Drug Administration (United States)
Anant Agrawal, U.S. Food and Drug Administration (United States)
Stephanie Matchette, U.S. Food and Drug Administration (United States)
T. Joshua Pfefer, U.S. Food and Drug Administration (United States)


Published in SPIE Proceedings Vol. NIH101:
Optical Imaging Workshop
Amir H. Gandjbakhche; Israel Gannot, Editor(s)

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