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Proceedings Paper

Characterization of Ba0.5Sr0.5TiO3 thin films for tunable microwave applications
Author(s): Sriraj G. Manavalan; Ashok Kumar; Thomas Weller
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Proc. SPIE 5648, Smart Materials III, ; doi: 10.1117/12.583485
Show Author Affiliations
Sriraj G. Manavalan, Univ. of South Florida (United States)
Ashok Kumar, Univ. of South Florida (United States)
Thomas Weller, Univ. of South Florida (United States)


Published in SPIE Proceedings Vol. 5648:
Smart Materials III
Alan R. Wilson, Editor(s)

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