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Proceedings Paper

Probes for a scanning near-field optical microscope on the base of tapered single-mode optical fiber
Author(s): V. F. Dryakhlushin; Alexander Yurievich Klimov; Vladimir Rogov
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Paper Abstract

Probes for a scanning near-field optical microscope on the base of a single-mode adiabatically tapered optical fiber have been fabricated by the chemical etching only. The transmission coefficient of light in this probes is 2 - 3 orders magnitude higher than that of mechanically pulled fiber probes. The probe may be used for green (λ = 0.48 - 0.55 μm), red (0.60 - 0.68 μm) and near infrared (0.78 = 1.05 μm) wavelength ranges. The reason of this effect is explained. Probe of the scanning near-field optical microscope on the base of microstrip line is proposed. Review of optical near-field microscopy, surface structure diagnostics and surface modification with nanometer resolution are observed.

Paper Details

Date Published: 24 September 2004
PDF: 8 pages
Proc. SPIE 5582, Advanced Optoelectronics and Lasers, (24 September 2004); doi: 10.1117/12.583463
Show Author Affiliations
V. F. Dryakhlushin, Institute for Physics of Microstructures (Russia)
Alexander Yurievich Klimov, Institute for Physics of Microstructures (Russia)
Vladimir Rogov, Institute for Physics of Microstructures (Russia)


Published in SPIE Proceedings Vol. 5582:
Advanced Optoelectronics and Lasers
Igor A. Sukhoivanov; Vasily A. Svich; Alexander V. Volyar; Yuriy S. Shmaliy; Sergy A. Kostyukevych, Editor(s)

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