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Proceedings Paper

Physical imaging of void using ultrafast light in optical precision
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Paper Abstract

This article shows the applications of ultrafast light in studying material optical properties and its application for rudimental imaging. Standard methods, when applied to the imaging, can not independently determine the material's thickness and index of refraction. The proposed method is fundamentally different from other imaging such as contrast difference in optical coherent tomography (OCT) or the peak-to-peak intensity ratio as in THz imaging to determine index of refraction and thickness. We show that the application of ultrafast techniques allows simultaneous measurements of material thickness and optical constants in optical precision from transmission measurements. Such finding invites new perspectives in imaging and other applicable disciplines.

Paper Details

Date Published: 21 February 2005
PDF: 10 pages
Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); doi: 10.1117/12.583393
Show Author Affiliations
Feng Huang, New Jersey Institute of Technology (United States)
John F. Federici, New Jersey Institute of Technology (United States)
Dale E. Gary, New Jersey Institute of Technology (United States)


Published in SPIE Proceedings Vol. 5647:
Laser-Induced Damage in Optical Materials: 2004
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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