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Proceedings Paper

Fitting X-ray multilayer reflectivities by means of the PPM code
Author(s): Daniele Spiga; Alessandro Mirone; Claudio Ferrero; Vincenzo Cotroneo; Giovanni Pareschi; Manuel Sanchez del Rio; Dervis Vernani
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Paper Abstract

A number of future hard X-ray (10-100 keV) telescopes will implement focusing optics with multilayer coatings. In this framework, we are developing (at INAF/Brera-Merate Astronomical Observatory) multilayer optics based on the e-beam deposition technique: this approach is suitable to coat very large surfaces at an high deposition rate; in order to test the performances of the deposited samples, X-ray reflectivity scans at the two "standard" photon energies of 8.05 and 17.4 keV are taken, returning very positive results with high peak reflectivities. However, the exact interpretation of the reflectivity curves is a complex task since it depends on a large number of parameters: the software PPM (Pythonic Program for Multilayers) has been recently developed by A. Mirone (ESRF) specifically to the aim of a friendly and fast determination of the parameters of multilayer structures. In particular, for this paper we present the layer-by-layer modelization of the characteristics (roughness, density, thickness) of multilayer stacks (Ni/C, Pt/C) by a multi-parametric "global" automatic optimization to reach the best fitting performances. In order to physically constrain the parameters, the data will be compared with the results of TEM measurements performed on the same samples, when available.

Paper Details

Date Published: 21 October 2004
PDF: 10 pages
Proc. SPIE 5536, Advances in Computational Methods for X-Ray and Neutron Optics, (21 October 2004); doi: 10.1117/12.583232
Show Author Affiliations
Daniele Spiga, Univ. degli Studi di Milano-Bicocca (Italy)
Osservatorio Astronomico di Brera (Italy)
Alessandro Mirone, European Synchrotron Radiation Facility (France)
Claudio Ferrero, European Synchrotron Radiation Facility (France)
Vincenzo Cotroneo, Osservatorio Astronomico di Brera (Italy)
Giovanni Pareschi, Osservatorio Astronomico di Brera (Italy)
Manuel Sanchez del Rio, European Synchrotron Radiation Facility (France)
Dervis Vernani, Osservatorio Astronomico di Brera (Italy)

Published in SPIE Proceedings Vol. 5536:
Advances in Computational Methods for X-Ray and Neutron Optics
Manuel Sanchez del Rio, Editor(s)

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