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Proceedings Paper

Multiple-pass Z-Scan for the characterization of partial transparent nonlinear optical materials
Author(s): Tatiana Bazaru; Ioan Dancus; Petronela S. Doia; Adrian Petris; Valentin Ionel Vlad
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Paper Abstract

The results obtained using Z-Scan methods (transmission -- TZ-Scan and multiple-pass -- MZ-Scan) for the characterization of the partial transparent nonlinear optical materials (NOM) are presented. For a typical NOM, a monocrystalline Si wafer with thickness 0.4 mm, at λ = 1060 nm, the nonlinear bulk effects are dominant in comparison with the nonlinear effects produced by the entrance interface (due to the sufficient large transmission of Si). In this case, the MZ-Scan at low laser intensity (several MW/cm2) can be analyzed similarly to the TZ-Scan, considering the multiple passes inside the sample and linear Fresnel reflections on both sample faces. Due to these multiple passes inside the sample, the sensitivity of the method is increased. The nonlinear optical susceptibility experimentally determined by multiple-pass Z-Scan is in agreement with a theoretical estimation of this parameter, with the results of other treatments of MZ-Scan and TZ-Scan and with its values obtained by two and four-wave mixing.

Paper Details

Date Published: 21 October 2004
PDF: 5 pages
Proc. SPIE 5581, ROMOPTO 2003: Seventh Conference on Optics, (21 October 2004); doi: 10.1117/12.583043
Show Author Affiliations
Tatiana Bazaru, National Institute for Laser, Plasma, and Radiation Physics (Romania)
Ioan Dancus, National Institute for Laser, Plasma, and Radiation Physics (Romania)
Petronela S. Doia, National Institute for Laser, Plasma, and Radiation Physics (Romania)
Adrian Petris, National Institute for Laser, Plasma, and Radiation Physics (Romania)
Valentin Ionel Vlad, National Institute for Laser, Plasma, and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 5581:
ROMOPTO 2003: Seventh Conference on Optics
Valentin I. Vlad, Editor(s)

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