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Proceedings Paper

Characterization of imaging conditions in 3D microscopy using thin uniform fluorescence calibration layers
Author(s): G. J. Brakenhoff; George W.H. Wurpel; J. M. Zwier
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Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, ; doi: 10.1117/12.582667
Show Author Affiliations
G. J. Brakenhoff, Univ. van Amsterdam (Netherlands)
George W.H. Wurpel, Univ. of Amsterdam (Netherlands)
J. M. Zwier, Univ. van Amsterdam (Netherlands)


Published in SPIE Proceedings Vol. 5701:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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